HDBK-217Plus™: 2015 (Pre-Notice 1)

HDBK-217Plus™: 2015 (Pre-Notice 1)

$200.00

This product has been superseded by HDBK-217Plus™: 2015, Notice 1 

Quanterion Solutions developed this update to the popular 217PlusTM ‘Handbook of Reliability Prediction Models’ to replace the 2006 edition developed for the Reliability Information Analysis Center (RIAC).  Available exclusively through Quanterion, 217Plus™:2015 contains new failure rate models covering Photonics components and updates to the twelve original 217Plus™ component failure rate models based on new data.

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Product Description

This product has been superseded by HDBK-217Plus™: 2015, Notice 1 

217Plus™:2015 is the latest revision to the popular 217Plus(TM) Handbook of Reliability Prediction Models based on the original MIL-HDBK-217, Reliability Prediction of Electronic Equipment. Available exclusively through Quanterion, 217Plus™:2015 contains new failure rate models covering Photonics components and updates to the twelve original 217Plus component failure rate models based on new data.

Quanterion’s long history with electronics prediction models and tools dates back to the development of PRISM, the System Reliability Assessment methodology and automated reliability prediction tool, developed in the 1990s by Qaunterion employees while working at the former Reliability Analysis Center (RAC) (later changed to RIAC). After 2000, PRISM remained in use but was not updated to include any new models. In 2005, when the RIAC was recompeted and awarded to a team that included Quanterion, these models were revisited and 217Plus™, an update to PRISM, was released shortly thereafter. 217Plus™, which doubled the number of models in PRISM and includes the complete prediction methodology for all of the major component categories in MIL-HDBK-217, was the only DoD-authorized and supported effort to expand the capabilities of PRISM.

217Plus™:2015 Calculator Tool

Accompanying the updated handbook is a new 217Plus™:2015 MS Excel® spreadsheet calculator that has been developed to facilitate the failure rate calculations of up to ten (10) hardware assemblies, and two (2) software assemblies, according to the component and system reliability models defined by Quanterion’s  217Plus™:2015 methodology.  All models are detailed in the 2015 version of the “Handbook of 217Plus Reliability Prediction Models” (HDBK-217Plus™:2015), available exclusively from Quanterion.   As an upgrade of the original 217Plus methodology from 2006, 217Plus™:2015 provides several new component models, updates to model parameters and refinements of several model equations.  It is recommended that the user obtain a copy of the new 217Plus™:2015 Handbook for detailed information on the new and revised models, the model development background, and associated reference tables and equations.  Quanterion provides product support to all registered users of the original 217Plus™ or 217Plus™:2015 spreadsheet calculators.”

217Plus™ Training

Quanterion also offers an online training video to familiarize reliability practitioners with this electronics reliability prediction methodology, as well as the 217Plus™ models and calculator tool. Click on the link above to learn more about this training program.

 

Copyright © 2014 by Quanterion Solutions Incorporated. This publication was developed by Quanterion Solutions Incorporated, and the materials contained within are protected by U.S. Copyright Law and may not be copied, automated, resold or re-distributed to multiple users without the express written permission of Quanterion Solutions Incorporated.  If copying, automating, reselling or re-distribution of this copyrighted material is desired, please contact 877.808.0097 (toll free) or 315.732.0097 for licensing information.

Additional information

Product Format

ISBN:

978-1-933904-91-7

Table of Contents

1 INTRODUCTION 1
2 217PLUSTM RELIABILITY PREDICTION MODELS 5
  2.1 MODEL OVERVIEW 5
    2.1.1 λIA,predecessor 7
    2.1.2 λobserved, predecessor 7
    2.1.3 Optional Data 8
    2.1.4 λpredicted, predecessor 8
    2.1.5 λIA,new 8
    2.1.6 λpredicted, new 8
    2.1.7 λ1 9
    2.1.8 ai 9
    2.1.9 bi 10
    2.1.10 AFi 10
    2.1.11 bi’ 10
    2.1.12 ao 11
    2.1.13 λ2 11
      2.1.13.1 Tailoring the Bayesian Constant, ao, in λ2 12
  2.2 COMPONENT MODELS 14
    2.2.1 Introduction to Component Models 14
      2.2.1.1 Global Constants 14
      2.2.1.2 Comments on Part Quality Levels 15
      2.2.1.3 Explanation of Failure Rate Units 16
    2.2.2 Capacitors 17
    2.2.3 Diodes 21
    2.2.4 Integrated Circuits, Plastic Encapsulated 25
    2.2.5 Integrated Circuits, Hermetic 29
    2.2.6 Inductors 33
    2.2.7 Transformers 36
    2.2.8 Optoelectronic Devices 39
    2.2.9 Switches 43
    2.2.10 Relays 46
    2.2.11 Connectors 49
    2.2.12 Resistors 52
    2.2.13 Thyristors 56
    2.2.14 Transistors 60
    2.2.15 Photonics Devices 64
    2.2.16 Software Failure Rate Prediction Model 68
    2.2.17 Default Values 70
  2.3 PART COUNT TABLES 73
  2.4 SYSTEM LEVEL MODEL 80
    2.4.1 Model Presentation 80
    2.4.2 217PlusTM Process Grading Criteria 83
      2.4.2.1 Design Process Grade Factor Questions 85
      2.4.2.2 Manufacturing Process Grade Factor Questions 97
      2.4.2.3 Part Quality Process Grade Factor Questions 105
      2.4.2.4 System Management Process Grade Factor Questions 111
      2.4.2.5 Can Not Duplicate (CND) Process Grade Factor Questions 119
      2.4.2.6 Induced Process Grade Factor Questions 122
      2.4.2.7 Wearout Process Grade Factor Questions 124
      2.4.2.8 Growth Process Grade Factor Questions 127
3 REFERENCES 129
APPENDIX A: 217PLUS MODEL DEVELOPMENT METHODOLOGY 131
  BACKGROUND 131
     Uncertainty in Traditional Approach Estimates 134
     Comparison of Different Methodologies 136
     The Nature of Predicting Reliability 137
  COMPONENT RELIABILITY MODELS 140
    Model Form 140
    Treatment of Environmental Stresses 143
    Acceleration Factors 144
    Reliability Growth of Components 144
    Failure Mode to Failure Cause Mapping 145
    Derivation of Base Failure Rates 147
    Software Reliability Model 148
      Determining the Reliability Growth Coefficient 149
      Converting Fault Density to An Operational Failure Rate 150
  SYSTEM RELIABILITY PREDICTION MODEL 151
    217PlusTM Background 151
      Methodology Overview 153
    System Reliability Model 154
    Initial Failure Rate Estimate 156
    Process Grading Factors 156
    Basis Data for the Model 158
      Uncertainty in Traditional Approach Estimates 158
      System Failure Causes 159
    Environmental Factor 165
    Reliability Growth 169
    Infant Mortality 170
    Combining Predicted Failure Rate with Empirical Data 171
APPENDIX B: TRADEOFF ANALYSIS 172